Scanning Electron Microscope
by Colin Cuthbert/science Photo Library
Title
Scanning Electron Microscope
Artist
Colin Cuthbert/science Photo Library
Medium
Photograph - Photograph
Description
Scanning electron microscope. Combined scanning electron microscope (SEM), scanning auger microsc- ope (SAM) and scanning probe microscope (SPM). The SEM scans a sample with an electron beam. The beam may be scattered off the sample or it may cause electrons to be emitted by it. These electrons are collected and translated into a three-dimensional image. The SAM can find the chemical composition of a sample on a microscopic scale. The SPM can image or alter material structures through the interaction of its probe with the material's surface. Photographed at the Centre for Nanoscale Science and Technology, University of Newcastle, England.
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February 16th, 2021
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