Scanning Electron Microscope
by Science Photo Library
Title
Scanning Electron Microscope
Artist
Science Photo Library
Medium
Photograph - Photograph
Description
Scanning electron microscope (SEM), cut-away illustration. An SEM uses an electron beam (vertical green line) to obtain a three-dimensional image of an object at magnifications much higher than can be obtained using light waves. The beam is scanned over the sample in a vacuum, causing the emission of secondary electrons (diagonal green line). These secondary electrons are detected and used to form the image.
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September 15th, 2018
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