Atom Probe Analysis
by Ammrf, University Of Sydney
Title
Atom Probe Analysis
Artist
Ammrf, University Of Sydney
Medium
Photograph - Photograph
Description
Coloured scanning electron micrograph (SEM) of a sample of aluminium (blue rod) being prepared for atom probe tomography (APT). The sample is welded to a platinum manipulation rod (right) so that it can be moved and correctly positioned. The sample will be welded to a silicon post then detached from the manipulator using an ion beam, at which point the sample will be ready for analysis. APT is an imaging technique used to visualise the position of each atom in a sample, along with its chemical composition.
Uploaded
June 29th, 2016
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