Measuring Dielectric Properties #1
by Science Photo Library
Title
Measuring Dielectric Properties #1
Artist
Science Photo Library
Medium
Photograph - Photograph
Description
MODEL RELEASED. Measuring dielectric properties. Researcher adjusting ellipsometric equipment. Ellipsometry is an optical technique that analyses the properties of dielectric materials, such as thin films (layers of material that are less than a millimetre thick). Dielectric materials are non-conducting substances that have unique properties in response to an electric field. Photographed at the National Physical Laboratory, in Teddington, UK.
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October 3rd, 2018
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